SN74BCT8374ADWRG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE 24SOIC
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Streamline your designs with SN74BCT8374ADWRG4 Texas Instruments Specialty Logic ICs, offering unmatched flexibility. Key benefits include configurable I/Os, wide temperature range support, and RoHS compliance, catering to renewable energy, military, and wearable tech sectors. Rely on Texas Instruments's decades of expertise. Click 'Inquire Now' for fast delivery options!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC
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