SN74ABT8646DWRE4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE 28-SOIC
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Enhance system performance with SN74ABT8646DWRE4 Texas Instruments Specialty Logic ICs, built for reliability and scalability. Featuring low propagation delay, high drive capability, and ESD protection, these ICs are perfect for networking equipment, test instruments, and smart appliances. Partner with Texas Instruments for top-tier logic components. Get in touch for samples and datasheets!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Bus Transceiver and Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC
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Texas Instruments