SN74LVTH18502APMG4
Texas Instruments

Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-LQFP
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SN74LVTH18502APMG4 Texas Instruments Specialty Logic ICs offer versatile solutions for complex circuit designs. With features like multi-function logic gates, programmable interfaces, and thermal protection, these ICs excel in aerospace, robotics, and embedded systems. Optimize your designs with Texas Instruments's industry-leading technology. Submit your inquiry today for bulk order discounts!
Specifications
- Product Status: Obsolete
- Logic Type: ABT Scan Test Device With Universal Bus Transceivers
- Supply Voltage: 2.7V ~ 3.6V
- Number of Bits: 18
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 64-LQFP
- Supplier Device Package: 64-LQFP (10x10)