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SN74LVTH18502APMG4

Texas Instruments
SN74LVTH18502APMG4 Preview
Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-LQFP
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Specifications

  • Product Status: Obsolete
  • Logic Type: ABT Scan Test Device With Universal Bus Transceivers
  • Supply Voltage: 2.7V ~ 3.6V
  • Number of Bits: 18
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 64-LQFP
  • Supplier Device Package: 64-LQFP (10x10)

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