SN74BCT8374ANTG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE W/FF 24-DIP
$0.00
Available to order
Reference Price (USD)
1+
$0.00000
500+
$0
1000+
$0
1500+
$0
2000+
$0
2500+
$0
Exquisite packaging
Discount
TT / Paypal / Credit Card / Western Union / Money Gram
Meet the SN74BCT8374ANTG4 Texas Instruments Specialty Logic ICs your go-to for high-density logic integration. Designed with advanced CMOS technology, these ICs provide seamless compatibility with FPGA/CPLD systems, ideal for AI, edge computing, and 5G infrastructure. Experience Texas Instruments's innovation firsthand. Contact our sales team for expert recommendations!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
Related Products
Microchip Technology
SY10EL16VCKG
NXP USA Inc.
N74F283D,602
Renesas Electronics America Inc
IDT74SSTU32864DBFG
NXP USA Inc.
SSTVF16857DGG,512
NXP USA Inc.
SSTUH32864EC/G,518
Microchip Technology
SY10EP16UZG
Renesas Electronics America Inc
SSTUA32864BHLF
onsemi
CD4007CN
NXP USA Inc.
SSTV16859DGG,118
Microchip Technology