SN74BCT8374ANT
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE W/FF 24-DIP
$4.13
Available to order
Reference Price (USD)
1+
$4.13000
500+
$4.0887
1000+
$4.0474
1500+
$4.0061
2000+
$3.9648
2500+
$3.9235
Exquisite packaging
Discount
TT / Paypal / Credit Card / Western Union / Money Gram
Enhance system performance with SN74BCT8374ANT Texas Instruments Specialty Logic ICs, built for reliability and scalability. Featuring low propagation delay, high drive capability, and ESD protection, these ICs are perfect for networking equipment, test instruments, and smart appliances. Partner with Texas Instruments for top-tier logic components. Get in touch for samples and datasheets!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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