SN74BCT8374ADWR
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE W/FF 24-SOIC
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Power next-gen applications with SN74BCT8374ADWR Texas Instruments Specialty Logic ICs, combining speed and durability. Highlights include radiation-hardened variants (for space tech), mixed-signal integration, and JTAG boundary scan support across automotive-grade and commercial versions. Let Texas Instruments accelerate your R&D. Request a callback for project-specific solutions!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC
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