SN74BCT8373ADWRG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE 24SOIC
$0.00
Available to order
Reference Price (USD)
1+
$0.00000
500+
$0
1000+
$0
1500+
$0
2000+
$0
2500+
$0
Exquisite packaging
Discount
TT / Paypal / Credit Card / Western Union / Money Gram
Upgrade your projects with SN74BCT8373ADWRG4 Texas Instruments Specialty Logic ICs, engineered for precision and efficiency. Key features include enhanced noise immunity, wide operating voltage ranges, and compact packaging, suitable for automotive, medical devices, and IoT applications. Trust Texas Instruments for cutting-edge logic solutions tailored to your needs. Request a quote now to explore customization options!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Latches
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC
Related Products
Renesas Electronics America Inc
SSTUB32864AHLF
STMicroelectronics
74ACT1284TTR
Texas Instruments
SN74LS31DRE4
Microchip Technology
SY10EP16VZC
onsemi
MC100EP16TDR2G
Texas Instruments
SN74ABT8652DLRG4
Microchip Technology
SY10EL16VDKC
onsemi
MC10H180PG
NXP USA Inc.
SSTVF16857DGV,118
Diodes Incorporated