SN74BCT8244ANTG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-DIP
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SN74BCT8244ANTG4 Texas Instruments Specialty Logic ICs offer versatile solutions for complex circuit designs. With features like multi-function logic gates, programmable interfaces, and thermal protection, these ICs excel in aerospace, robotics, and embedded systems. Optimize your designs with Texas Instruments's industry-leading technology. Submit your inquiry today for bulk order discounts!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Buffers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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