SN74BCT8240ANTG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-DIP
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The SN74BCT8240ANTG4 Texas Instruments Specialty Logic IC series redefines digital efficiency. Featuring ultra-low static current, Schmitt-trigger inputs, and space-saving DFN packages, these ICs shine in battery-powered devices, sensor interfaces, and motor control systems. Choose Texas Instruments for logic that grows with your demands. Email us for volume pricing!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Inverting Buffers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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