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SN74ABT8952DW

Texas Instruments
SN74ABT8952DW Preview
Texas Instruments
IC SCAN-TEST-DEV/XCVR 28-SOIC
$6.62
Available to order
Reference Price (USD)
1+
$6.62000
500+
$6.5538
1000+
$6.4876
1500+
$6.4214
2000+
$6.3552
2500+
$6.289
Exquisite packaging
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Specifications

  • Product Status: Obsolete
  • Logic Type: Scan Test Device with Registered Bus Transceiver
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 8
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 28-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package: 28-SOIC

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